<bump>
Basis: [Environmental Testing; Part 2: Tests; Test Eb and Guideline Continuous Bump;DIN IEC 60068-2-29;;all;]
Serves, in most cases, for testing components which are mounted in hoods, doors, steering knuckles or, generally, are located near locking devices.
Figure 70: Structure of continuous bump
Form of excitation:
Half-sine
Acceleration amplitude:
a Acceleration amplitude
ABS = 25 g
Load duration:
t Load duration
ABS = 6 ms
Number of loads:
330
Ambient conditions
Other conditions:
Test temperatures are -40 °C, ambient temperature and 90 °C.
Operating states:
1.2
Evaluation criteria
Input criteria:
The approval of the previous function test is regarded as an electrical evaluation. Furthermore, the device is examined with respect to mechanical changes.
Output criteria:
The test is approved if the device parameters corresponding to the function of the DUT are within the specified limits after the shock test.
Cracks and other mechanical damages are not admissible.
Additional specifications:
Loads are applied per direction and per temperature.
Visual inspection of the DUT.
Pre-heating of the devices until reaching the test temperature. The minimum dwell time at this temperature is one hour before the begin of the shock test. The shock test has to be terminated at the latest 2 minutes after taking the DUT out of the conditioning temperature.
Repetition of this process at the other two test temperatures.
Visual inspection of the DUTs after the test end.